Jan
19
8:00 AM08:00

Workshop on Advanced Metrology for Emerging Semiconductors

  • Texas A&M Hotel and Conference Center (map)
  • Google Calendar ICS

The one-day workshop will focus on the significant challenges facing the development of Quantum Materials and Devices, Emerging Memories, and Semiconductors in Unconventional Environments whose properties and behavior are not well-characterized.  The need for methods available to achieve accurate characterization will be discussed among the participants to start engaging the science and engineering community in developing a vision and a roadmap that will guide US future advances in this area. The workshop will bring experts from the government, industry, and the faculty and students of Texas A&M University to discuss critical and timely topics on the metrology of semiconductor manufacturing.

Registration Deadline: January 17, 2024

One-Page Proceedings Summaries: Participants will have the opportunity to highlight their work through one-page summaries, which will be part of the Workshop Proceedings. Submit content here. Deadline: January 9, 2024

Posters: A limited number of posters will be selected for the poster forum that will be part of the workshop. Submit content here. Deadline: January 9, 2024

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